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Research infrastructure
RWTH Aachen University
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Category
Microscopes
Spectrometry & Chromatography
Testing Systems
X-ray Techniques
Analytical Laser Devices
Environmental / Sample Analysis
Environmental Monitoring Systems
Geoscientific Sensors
Communication / Network Analysis
Imaging Systems
Mechanical Engineering / Manufacturing
3D Printing / Additive Manufacturing
Cleanroom & Semiconductor Fabrication
Chemical / Bioprocess Engineering
Testing & Demonstration Systems
Fluid Dynamics & Environmental Facilities
Crash and Load Testing Facilities
Climate Simulation
High-Tech Research
Medical & Diagnostic Centers
Liquid Handling
Cell and Molecular Biology
Sample / Storage Logistics
Robotics Solutions
Computing Infrastructure
Storage / Cloud Systems
Visualization
Simulation / Control
Specialized Platforms
Vehicle and Transportation Technology
Aerospace
Energy and Environment
Construction, Geosciences, Medicine
Laboratory Hygiene
Cleanroom and Sample Areas
Environmental Protection
Specialized Safety
Atomic layer deposition
Chemical vapor deposition
Ion-beam deposition
Physical vapor deposition
Electron-beam lithography
Laser lithography
Nanoimprint lithography
Photolithography
Rapid thermal processing
Thermal processing
High-pressure extraction
Bonding
Dicing
Pull/shear testing
Reactive ion etching
Chemical mechanical polishing
Ion-beam etching
Plasma etching/ashing
Vapor-phase etching
Atomic layer etching
Thermal etching
Lift-off
Acids and bases
Plating
2D materials
Acids and bases
Solvents
Resist development
Resist coating
Resist coating + solvants
Lift-off
RCA clean
Optical microscopy
Optical spectroscopy
Optical surface profilometry
Raman spectroscopy
Ellipsometry
Tactile surface profilometry
Solar simulation
Impedance spectroscopy
Device characterization
Electrochemical capacitance-voltage profiling
Scanning electron microscopy
Optical emission sepctroscopy
Secondary ion mass spectroscopy
Atomic force microscopy
Photo-induced force microscopy
Kelvin Probe Force Microscopy
X-ray analytics
Type of instrument
Name of the parent reasearch infrastructure (optional)
Additional methods and synergies with other instruments (optional)
Identification code (optional)
Short description of the instrument (max. 5000 characters)
Manufacturer
Year of acquisition (optional)
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Model
Necessary / restrictive conditions for use (optional)
User groups (Please select)
Internals
Externals
Internals and externals
Type of usage (Please select)
Service (intern and extern)
Operator
Service and operator
Faculty
Faculty 1 – Mathematics, Computer Science and Natural Sciences
Faculty 2 – Architecture
Faculty 3 – Civil Engineering
Faculty 4 – Mechanical Engineering
Faculty 5 – Georesources and Materials Engineering
Faculty 6 – Electrical Engineering and Information Technology
Faculty 7 – Arts and Humanities
Faculty 8 – School of Business and Economics
Faculty 10 – Medicine
Department / teaching unit (optional)
Institutional identification number (IKZ)
Website (optional)
Adress (optional)
Contact person
Email address (optional)
Comment field (optional, max. 5000 characters)
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